CVE Catalog

CVE-2026-41665

MediumCVSS 6.1
Published: Updated: Translated: NVD NIST

Exploitation Probability (EPSS)

Low risk
0.14%

3th percentile - higher than 3% of all known CVEs

Summary

Integer overflow in scratch buffer initialization size calculation in Samsung Open Source ONE causes incorrect memory initialization for large intermediate tensors. Affects versions prior to commit 1.30.0.

Risk Assessment

Incorrect memory initialization may lead to undefined behavior, data leaks, or crashes.

Recommendation

Update Samsung Open Source ONE to commit 1.30.0 or later.

Other vulnerabilities in Samsung Open Source ONE

See all
Original NVD description (English source)

Integer overflow in scratch buffer initialization size calculation in Samsung Open Source ONE cause incorrect memory initialization for large intermediate tensors. Affected version is prior to commit 1.30.0.

Vulnerability data from NVD (NIST) · CISA KEV · EPSS